Rapid autotuning for crystalline specimens from an inline hologram.
نویسندگان
چکیده
A method to measure the aberration function for a crystalline specimen from a single inline hologram or 'Ronchigram' by dividing it up into small patches is derived. Measurement of aberrations is demonstrated from both dynamical simulations and experimental Ronchigrams. This method should allow rapid fine-tuning on a variety of crystalline specimens and represents a key step toward active optics for scanning transmission electron microscopy.
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عنوان ژورنال:
- Journal of electron microscopy
دوره 57 6 شماره
صفحات -
تاریخ انتشار 2008